Description: It is used to characterize the microstructure of the semi-crystallinity polymers, including the crystallinity, crystal orientation, lamellar thickness, lamellar orientation, porosity, and micro-fibril, etc. Various types of samples such as polymeric solutions, films, fibers, gels can be used for the technique.
Model: Xeuss 2.0 system (Xenocs, SA)
Beam: micro-focus beam spot with a adjustable size up to 1.2 mm
Collimation system: single three-dimensional fully reflective multilayer film X-ray parallel beam focusing mirror with double slit scatter-free collimation system
Sample-to-detector distances range：30 cm-2.5 m
Detection range of scattering vector: the minimum scattering vector (qmin) can be ≤0.025 nm-1, while the maximum value (qmax) can be ≥40.6 nm-1.
Operating chamber: The measurement is performed in an air o vacuum environment, and the system is equipped with a variety of different stages to satisfy the experimental requirements.
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