Transmission electron microscopy (TEM)

Description: It is used to observe the microstructural and crystal morphologies in a nano-meter scale. The functions for TEM include transmission bright-field image, dark-field image, electron diffraction, etc.

Model: H-800/Hitachi

Tungsten electron gun:

       Acceleration voltage: 75-200 kV

       Magnification: 1200× - 300000×



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